Electrical characterization of metal-oxide-InP tunnel diodes based on current-voltage, admittance and low frequency noise measurements
- 31 May 1995
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 38 (5) , 1035-1043
- https://doi.org/10.1016/0038-1101(95)98672-p
Abstract
No abstract availableKeywords
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