Limitations to depth resolution in ion scattering experiments
- 1 July 2001
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 183 (1-2) , 16-24
- https://doi.org/10.1016/s0168-583x(01)00313-5
Abstract
No abstract availableThis publication has 38 references indexed in Scilit:
- Average kinetic energy of atoms in a solid measured with resonant nuclear reactionsPhysical Review B, 1998
- Influence of atomic excitation processes on yield curves of narrow nuclear resonancesJournal of Physics B: Atomic, Molecular and Optical Physics, 1994
- Energy and medium dependence of the Lewis effect in high resolution excitation curves near narrow nuclear resonancesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1994
- High energy resolution ion beam techniques for novel investigations in nuclear, atomic and applied physics using narrow nuclear resonancesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
- Segregation at the(111) surface studied by medium-energy ion scatteringPhysical Review B, 1990
- SPACES: A PC implementation of the stochastic theory of energy loss for narrow-resonance depth profilingNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- H−, H0, H+ He0, He+ and He2+ fractions of projectiles scattered from 14 different materials at 30 to 340 keVNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- Depth profiling with narrow resonances of nuclear reactions: Theory and experimental useNuclear Instruments and Methods in Physics Research, 1982
- Anomalies in Yield Curves over the 992-kevAl27(p, γ)Si28ResonancePhysical Review B, 1962
- Straggling Effects on Resonant YieldsPhysical Review B, 1962