Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode

Abstract
The reconstructed Si (111) 7×7 surface was imaged in several operation modes of the combined ultrahigh vacuum atomic force microscope/scanning tunnel microscope. By imaging single atom defects on the sample surface a clear proof of the atomic resolution in noncontact mode of the force microscope was possible. By simultaneous measurements of several interaction parameters and by the investigation of force‐distance curves, it was possible to explain the origin of the interaction.

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