Abstract
Thin Nb films from 30 to 150 Å thick have been electron-beam evaporated onto sapphire substrates with aluminum overlayers, then deposited to protect the surface. Tc's and magnetoresistance were found to be consistent with localization models, and measured parallel critical fields fit a generalized Ginzburg-Landau theory. Perpendicular critical fields, however, were found to have an anomalous curvature near Tc. These results, we believe, are due to the disorder of the film and have also been seen in other systems.