Automatically Controlled 2-Vessel Pressure-Cooker Test-Equipment
- 1 June 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-32 (2) , 164-167
- https://doi.org/10.1109/TR.1983.5221516
Abstract
A highly accelerated humidity test for plastic encapsulated IC reliability short-term evaluation has been studied. 2-Vessel pressure cooker test (PCT) equipment capable of controlling relative humidity and temperature independently, and of keeping specimens free from water droplet condensation, has been designed. This equipment consists of a test chamber and a vapor chamber. Humidity conditions are set by controlling the temperature difference between the test chamber and the vapor chamber. Humidity levels are controlled with the direct pressure adjustment. The whole test chamber is heated in an oven, thereby obtaining temperature stability and uniformity. Using this equipment, humidity tests were carried out on plastic molded ICs. As a result, good test reproducibility and excellent correlation in test results between PCT and conventional humidity test such as 85°C/85%RH, were obtained. As a consequence, it was found possible, in a short time, to evaluate plastic molded IC reliability quantitatively in humidity ambients using this 2-vessel PCT equipment. This equipment can be used for quality assurance testing of plastic-encapsulated ICs in a short time.Keywords
This publication has 2 references indexed in Scilit:
- Acceleration Factors for IC Leakage Current in a Steam EnvironmentIEEE Transactions on Reliability, 1980
- The accelerated ageing of plastic encapsulated semiconductor devices in environments containing a high vapour pressure of waterMicroelectronics Reliability, 1974