Developments and perspectives of scanning probe microscopy (SPM) on organic materials systems
Open Access
- 28 February 1998
- journal article
- Published by Elsevier in Materials Science and Engineering: R: Reports
- Vol. 21 (5-6) , 221-295
- https://doi.org/10.1016/s0927-796x(97)00012-0
Abstract
No abstract availableKeywords
This publication has 100 references indexed in Scilit:
- Molecular folds in polyethylene observed by atomic force microscopyPolymer, 1994
- Atomic force microscopy characterization of poly(amino acid) Langmuir-Blodgett filmsLangmuir, 1993
- Video-STM, LEED and X-ray diffraction investigations of PTCDA on graphiteZeitschrift für Physik B Condensed Matter, 1992
- Transmission electron microscopic fracture studies of polymer interfacesMacromolecules, 1992
- Ordering of copolymer thin films as revealed by atomic force microscopyMacromolecules, 1992
- Molecular resolution of Langmuir-Blodgett monolayers on tungsten diselenide by scanning tunneling microscopyZeitschrift für Physik B Condensed Matter, 1990
- Scanning tunneling microscopy of polyimide monolayers prepared by the Langmuir-Blodgett techniqueLangmuir, 1990
- Islands and holes on the free surface of thin diblock copolymer films. I. Characteristics of formation and growthJournal de Physique, 1990
- The crystalline core of the row structures in isotactic polystyrene. I. Nucleation and growthJournal of Polymer Science: Polymer Physics Edition, 1979
- Morphology of dendritic polyethylene crystalsJournal of Polymer Science, 1961