Complex permittivity measurement of optoelectronic substrates
- 27 March 1986
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 22 (7) , 399-400
- https://doi.org/10.1049/el:19860271
Abstract
We propose and analyse new techniques to measure both transverse and longitudinal dielectric constants and the loss tangent of anisotropic dielectric samples usually used in integrated optics such as LiNbO3Keywords
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