Light scattering effects in CPM and PDS measurement on a-Si:H films
- 1 December 1989
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 114, 405-407
- https://doi.org/10.1016/0022-3093(89)90599-1
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Density of the gap states in undoped and doped glow discharge a-Si:HSolar Energy Materials, 1983
- Direct measurement of gap-state absorption in hydrogenated amorphous silicon by photothermal deflection spectroscopyPhysical Review B, 1982
- Photothermal spectroscopy of scattering mediaApplied Optics, 1982