Photothermal measurements on optical thin films
- 1 November 1995
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 34 (31) , 7239-7253
- https://doi.org/10.1364/ao.34.007239
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 75 references indexed in Scilit:
- Modeling of signal detection by using the photothermal probe beam deflection techniqueReview of Scientific Instruments, 1994
- Photothermal displacement technique: A method to determine the variation of thermal conductivity versus temperature in siliconReview of Scientific Instruments, 1993
- Laser-induced damage threshold and absorption measurements in rare-gas-halide excimer laser componentsOptics Communications, 1989
- Frequency-modulated impulse response photothermal detection through optical reflectance 1: TheoryApplied Optics, 1988
- Ageing Influence on the Absorption and Laser Damage Resistance of Ta2O5Thin FilmsJournal of Modern Optics, 1987
- Absorption-influenced Laser Damage Resistance of Ta 2 O 5 CoatingsOptica Acta: International Journal of Optics, 1986
- Applications of photoacoustic sensing techniquesReviews of Modern Physics, 1986
- A pulsed thermoelastic analysis of photothermal surface displacements in layered materialsJournal of Applied Physics, 1985
- Simple expressions for predicting the effect of volume and interface absorption and of scattering in high-reflectance or antireflectance multilayer coatingsJournal of the Optical Society of America, 1980
- A simple method for calculating the optical properties of multilayer-dielectric reflectors*Journal of the Optical Society of America, 1977