SIMS study of deuterium distribution in chemically charged aluminum containing oxide layer defects and trapping sites
- 17 October 2005
- journal article
- Published by Elsevier in Journal of Alloys and Compounds
- Vol. 415 (1-2) , 134-142
- https://doi.org/10.1016/j.jallcom.2005.08.031
Abstract
No abstract availableKeywords
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