TECHNIQUES FOR THE PRESERVAATION OF THREE‐DIMENSIONAL STRUCTURE IN PREPARING SPECIMENS FOR THE ELECTRON MICROSCOPE*
- 1 February 1951
- journal article
- Published by Wiley in Transactions of the New York Academy of Sciences
- Vol. 13 (4 Series I) , 130-134
- https://doi.org/10.1111/j.2164-0947.1951.tb01007.x
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- The Use of Critical Point Phenomena in Preparing Specimens for the Electron MicroscopeJournal of Applied Physics, 1950
- An Electron Microscope Study of Some Structural Colors of InsectsJournal of Applied Physics, 1942
- Coherent Expanded-AerogelsThe Journal of Physical Chemistry, 1932