Seeman–Bohlin X-ray diffractometer for thin films

• 1 October 1970
• journal article
• research article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 3  (5) , 372-379
• https://doi.org/10.1107/s0021889870006441

Abstract

Keywords

• FILMS
• SEEMAN
• X RAY DIFFRACTOMETER
• BOHLIN X RAY
• DIFFRACTOMETER FOR THIN