Optical nonlinearity of CdSe microcrystallites in a sputtered SiO2 film
- 3 December 1990
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 57 (23) , 2393-2395
- https://doi.org/10.1063/1.104176
Abstract
Optical nonlinearity of a sputtered SiO2 film containing CdSe microcrystallites with an average diameter of 15 Å is measured by degenerate four‐wave mixing (DFWM) experiments. An effective nonlinear cross section σeff of 1.4×10−16 cm2 is obtained. The DFWM signal as a function of the probe delay time shows biexponential behavior with a fast decay time of 10 ps and a slow decay time of 60 ps, which give fast and slow carrier recombination times as 20 ps and 120 ps. The third‐order susceptibility ‖χ(3)‖ is estimated to be 1.3×10−8 esu. The photodarkening and laser annealing effects which are serious problems for device applications are not observed.Keywords
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