Simulation of annular dark field stem images using a modified multislice method
- 1 January 1987
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 23 (1) , 77-96
- https://doi.org/10.1016/0304-3991(87)90229-4
Abstract
No abstract availableKeywords
This publication has 28 references indexed in Scilit:
- Improved high resolution image processing of bright field electron micrographsUltramicroscopy, 1985
- Improved high resolution image processing of bright field electron micrographs: I. TheoryUltramicroscopy, 1984
- Computerized analytical electron microscope for elemental imagingReview of Scientific Instruments, 1984
- Digital acquisition and processing of electron micrographs using a scanning transmission electron microscopeUltramicroscopy, 1981
- Fast digital data acquisition and on-line processing system for an HB5 scanning transmission electron microscopeReview of Scientific Instruments, 1981
- Innovative imaging and microdiffraction in stemUltramicroscopy, 1978
- Approximations for dynamical calculations of microdiffraction patterns and images of defectsActa Crystallographica Section A, 1978
- A new theoretical and practical approach to the multislice methodActa Crystallographica Section A, 1977
- Numerical evaluations ofN-beam wave functions in electron scattering by the multi-slice methodActa Crystallographica Section A, 1974
- The scattering of electrons by atoms and crystals. I. A new theoretical approachActa Crystallographica, 1957