Fit of the function y(x) = A [1 − exp(−kx)] to data strongly embedded in noise

• 1 December 1981
• journal article
• Published by Elsevier in Nuclear Instruments and Methods in Physics Research
• Vol. 190  (2) , 333-336
• https://doi.org/10.1016/0029-554x(81)90296-2

Abstract

Keywords

• EXP
• FUNCTION
• FIT
• EMBEDDED IN NOISE
• DATA STRONGLY EMBEDDED