A Positive Regression of Yield on Maturity in Sorghum1
- 1 May 1967
- journal article
- research article
- Published by Wiley in Crop Science
- Vol. 7 (3) , 271
- https://doi.org/10.2135/cropsci1967.0011183x000700030035x
Abstract
A positive regression between high yields and late maturity is demonstrated for grain sorghum. This regression should be considered when hybrid performance is tested. The use of this high yield‐late maturity relationship should assist in the detection of the more productive hybrids at all levels of maturity.This publication has 0 references indexed in Scilit: