Kinetics of Phase Formation in Cu-Al Thin Films Couples Studied by In-Situ X-Ray and Rutherford Backscattering Analysis.
- 1 January 1983
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Growth kinetics of the θ phase in AlCu thin film bilayersThin Solid Films, 1978
- Interdiffusion in the Al–Cu SystemTransactions of the Japan Institute of Metals, 1971