Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes
- 1 April 2002
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 389-393, 427-430
- https://doi.org/10.4028/www.scientific.net/msf.389-393.427
Abstract
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