On the electric field distribution within the field ion microscope and near the surface of field emitters

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Abstract
The electric field distribution within a field ion microscope is determined numerically. Realistic geometries are considered and the specimen is given shape. It is found that neglect of geometric features which are as far as 105 tip diameters away from the specimen can yield inaccurate results. A 9 degrees variation in shank angle is shown to induce a 40% change in the field near the specimen which can alter the ion trajectories and significantly modify the specimen stress distribution.