Self-aligned passivation on copper interconnection durability against oxidizing ambient annealing
- 16 August 1993
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 63 (7) , 934-936
- https://doi.org/10.1063/1.109849
Abstract
A self-aligned niobium (Nb) passivation method has been developed in order to improve the stability of copper (Cu) in an oxidizing ambient. A Cu/Nb/SiO2/(100)Si structure was annealed between 400 and 850 °C for 30 min in a gas mixture of H2 and N2. The underlying Nb diffused to the Cu surface and turned into its nitride at 750 °C. The surface Nb nitride layer acted as a passivation layer against oxidation. The passivated Cu was found to retain its resistivity of 2.0 μΩ cm even after oxidation at 400 °C for 30 min in a dry oxygen ambient.Keywords
This publication has 2 references indexed in Scilit:
- Reaction between Cu and TiSi2 across different barrier layersApplied Physics Letters, 1990
- Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External SurfacesPhysical Review B, 1970