Relative intensities and time characteristics of Raman scattering and luminescence under nearly resonant light excitation

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Abstract
Various characteristics of frequency-integrated intensities of secondary radiation components near the resonance excitation region have been calculated for a three-level system coupled with a reservoir using a stochastic model. It has been found that the spectral and temporal characteristics of the resonant second-order optical processes can be understood consistently by considering that Raman scattering results from the average value of the induced-dipole moment with respect to the energy fluctuation due to the system-reservoir interaction, while luminescence results from its deviation from the average value. A simple method to determine parameter values that characterize the excited-state dynamics in condensed phases from the secondary radiation data is also discussed.