The resolving power of a low-energy electron diffractometer and the analysis of surface defects
- 1 October 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 99 (3) , 695-713
- https://doi.org/10.1016/0039-6028(80)90563-4
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Crystal surface diffraction of partially coherent beamsSurface Science, 1980
- Quantitative island size determination in the chemisorbed layer W(110) p(2 × 1)-O: I. Instrument response function and substrate perfectionSurface Science, 1979
- Coherence length and/or transfer width?Surface Science, 1979
- The LEED Instrument Response FunctionReview of Scientific Instruments, 1971
- Low-energy electron diffraction from imperfect structuresSurface Science, 1970
- The effect of registry degeneracy on leed beam profilesSurface Science, 1969
- Laser simulation of leed patternsSurface Science, 1968
- Low-energy electron diffraction and surface structural chemistryProgress in Solid State Chemistry, 1965
- Chemisorption and ordered surface structuresSurface Science, 1964
- Scattering Factors and Other Properties of Low-Energy Electron DiffractionJournal of Applied Physics, 1963