X-Ray Investigation of Perfection in Tin Whiskers

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Abstract
Tin whiskers with elasticities far above that of bulk tin were examined for perfection by x‐ray diffraction. Intensities were measured for several whiskers varying in diameter from 2 μ to 11 μ. Some of the data were obtained by means of a Geiger counter with CuKα radiation and some by photographic methods with MoKα radiation. The observed structure factors were corrected for extinction according to the dynamical theory of x‐ray diffraction with the crystallite size as a parameter and then compared to the calculated structure factors. The agreement with dynamical theory for imperfect crystals is very good, yielding a crystallite size of 1.5 μ for a 5.5 μ whisker and 2.7 μ for whiskers of about 10 μ in diameter. The whiskers were observed growing in several crystallographic directions.

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