Resistive-gate-induced thermal noise in IGFETs
- 1 August 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 16 (4) , 414-415
- https://doi.org/10.1109/jssc.1981.1051611
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Theory of Noise in Charge-Transfer DevicesBell System Technical Journal, 1974
- Treatment of Microscopic Fluctuations in Noise TheoryBell System Technical Journal, 1974
- Theory of noise in metal oxide semiconductor devicesIEEE Transactions on Electron Devices, 1965