High-Resolution Transmission Electron Microscopy of Defects in YBa2Cu4O8
- 1 November 1989
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 28 (11A) , L1942
- https://doi.org/10.1143/jjap.28.l1942
Abstract
Microscopic structures of the high-T c superconductor YBa2Cu4O8 (T c=80 K) are examined by high-resolution transmission electron microscopy. Planar defects are observed as white spot lines in the micrograph of the single-phase YBa2Cu4O8 and they have a structure with an absence of one Cu-O chain in the double Cu-O chain of YBa2Cu4O8. YBa2Cu3O7 and Y2Ba4Cu7O15-like local structures exist around the planar defects.Keywords
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