Insect tagging: Natural versus laboratory-grown screwworm flies
- 31 August 1972
- journal article
- research article
- Published by Elsevier in The International Journal of Applied Radiation and Isotopes
- Vol. 23 (8) , 381-382
- https://doi.org/10.1016/0020-708x(72)90120-2
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970