Effects of uniaxial stress and temperature variation on theCr2+center in GaAs

Abstract
The effects both of applied uniaxial stress and of temperature variation on the EPR spectrum of Cr2+ in GaAs have been studied. The rapid stress-induced alignment of the Cr2+ centers at 4.2 K shows that the observed tetragonal symmetry is due to the Jahn-Teller effect as was previously suggested. The Jahn-Teller coefficient VE for an E-symmetry distortion mode is 0.85±0.09 eV/Å and the Jahn-Teller splitting 3EJT of the ground T25 manifold is estimated. Stress has only a small effect on the spin-Hamiltonian parameters in agreement with the large EJT found. When taken together with previous optical work the results imply a significant Jahn-Teller splitting in the E5 state also. The EPR lines broaden in the 9—20-K temperature range and the temperature-dependent linewidth parameter T21 is deduced from both the observed signal amplitudes and linewidths of the inhomogeneously broadened lines. The relation T21=(T21)0exp(ΔEkT) is obeyed with ΔE=67±5 cm1. Comparison with recent ultrasonic attenuation studies in GaAs: Cr shows that T21τ1, the Cr2+ reorientation rate. The dependence of T21 on temperature is probably due to motional broadening.