Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing
- 31 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Electron Beam Test System for GHz-Waveform Measurements on Transmission Lines within MMICPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1992
- 5-100 GHz InP coplanar waveguide MMIC distributed amplifierIEEE Transactions on Microwave Theory and Techniques, 1990
- Subpicosecond sampling using a noncontact electro-optic probeJournal of Applied Physics, 1989
- Fundamentals of electron beam testing of integrated circuitsScanning, 1983