Acid−Base Characterization of Aluminum Oxide Surfaces with XPS

This publication has 30 references indexed in Scilit:

• Acid–base characterisation of flat oxide-covered metal surfaces
  Vacuum, 2002
• Bonding and XPS chemical shifts in ${\mathrm{ZrSiO}}_4$ versus ${\mathrm{SiO}}_2$ and ${\mathrm{ZrO}}_2:$ Charge transfer and electrostatic effects
  Physical Review B, 2001
• Mechanisms responsible for chemical shifts of core-level binding energies and their relationship to chemical bonding
  Journal of Electron Spectroscopy and Related Phenomena, 1999
• Auger parameter and Wagner plot in the characterization of chemical states by X-ray photoelectron spectroscopy: a review
  Journal of Electron Spectroscopy and Related Phenomena, 1998
• Theoretical analysis of the O(1s) binding-energy shifts in alkaline-earth oxides: Chemical or electrostatic contributions
  Physical Review B, 1994
• Improved adhesion strength between aluminum and ethylene copolymers by hydration of the aluminum surface
  Journal of Applied Polymer Science, 1993
• X-ray photoelectron spectroscopy study of Sr and Ba compounds
  Journal of Electron Spectroscopy and Related Phenomena, 1991
• Optical and magneto-optic properties of HgTe/CdTe superlattices in the inverted-band semiconducting regime
  Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
• The auger parameter, its utility and advantages: a review
  Journal of Electron Spectroscopy and Related Phenomena, 1988
• Planar Models for Alumina-Based Catalysts
  Catalysis Reviews, 1984