Photon Emission Analysis of Defect-Free 4H-SiC pn Diodes in Avalanche Regime

• 1 April 2002
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 389-393, 1293-1296
• https://doi.org/10.4028/www.scientific.net/msf.389-393.1293

Abstract

Keywords

• AVALANCHE BREAKDOWN
• P+-N-N+ DIODES
• PHOTON EMISSION
• STRIATIONS