Testability implemented in the VAX 6000 model 400
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 109-114
- https://doi.org/10.1109/test.1990.114007
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A new framework for analyzing test generation and diagnosis algorithms for wiring interconnectsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Functional test and diagnosis: a proposed JTAG sample mode scan testerPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002