Fringe Pattern Analysis Using Fourier Transform Techniques
- 3 April 1990
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 1121, 130-135
- https://doi.org/10.1117/12.961260
Abstract
The system of retrieving the phase from a single interferogram with carrier frequency based on 2-D Fourier transform method is presented. Several procedures to modify an interferogram and its spectrum in order to reduce the phase errors and detect the object domain are described. The effects of refinements introduced are shown on experimental data.This publication has 0 references indexed in Scilit: