X-ray photoelectron spectroscopic studies on ZnO/Bi2O3 varistors

• 1 June 1981
• journal article
• research article
• Published by Wiley in Surface and Interface Analysis
• Vol. 3  (3) , 142-145
• https://doi.org/10.1002/sia.740030308

Abstract

Keywords

• ZNO/BI2O3
• VARISTORS
• INTERGRANULAR LAYER
• LOSS
• SMOOTHLY
• VOLTAGE
• SPECTROSCOPIC
• SINTERING