Breakdown in Ceramic Capacitors Under Pulsed High-Voltage Stress
- 1 December 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 1 (4) , 423-428
- https://doi.org/10.1109/tchmt.1978.1135298
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Breakdown in silicon oxide−A reviewJournal of Vacuum Science and Technology, 1977
- Thickness Influence in Breakdown Phenomena of Thin Dielectric FilmsPhysica Status Solidi (b), 1964
- Insulation Breakdown as a Function of AreaTransactions of the American Institute of Electrical Engineers, 1948
- Dielectric and Piezoelectric Properties of Barium TitanatePhysical Review B, 1947