Charging and discharging of defect states in CIGS/ZnO junctions

• 1 February 2000
• journal article
• Published by Elsevier in Thin Solid Films
• Vol. 361-362, 140-144
• https://doi.org/10.1016/s0040-6090(99)00787-7

Abstract

Keywords

• CIGS
• CU(INGA)SEX
• ZINC OXIDE
• JUNCTIONS
• FIELD
• DEFECTS
• METASTABILITY