Simultaneous measurement of thicknesses and refractive indices of multiple layers by a low-coherence confocal interference microscope
- 1 December 1996
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 21 (23) , 1942-1944
- https://doi.org/10.1364/ol.21.001942
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 10 references indexed in Scilit:
- Determination of the refractive index of highly scattering human tissue by optical coherence tomographyOptics Letters, 1995
- Multiple scattering in optical coherence microscopyApplied Optics, 1995
- Confocal imaging of a stratified mediumApplied Optics, 1994
- Measurement of corneal thickness by low-coherence interferometryApplied Optics, 1992
- High-speed optical coherence domain reflectometryOptics Letters, 1992
- Optical Coherence TomographyScience, 1991
- Absolute optical ranging using low coherence interferometryApplied Optics, 1991
- Optical coherence-domain reflectometry: a new optical evaluation techniqueOptics Letters, 1987
- White-Light Interferometric Thickness GaugeApplied Optics, 1972