Theory of the four-point probe technique as applied to the measurement of the conductivity of thin layers on conducting substrates
- 1 September 1966
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 17 (9) , 1143-1148
- https://doi.org/10.1088/0508-3443/17/9/305
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Four-point probe measurement of non-uniformities in semiconductor sheet resistivitySolid-State Electronics, 1964
- Minute Resistivity Variations in Germanium Crystals and Their Effect on DevicesJournal of the Electrochemical Society, 1962
- Measurement of Sheet Resistivities with the Four-Point ProbeBell System Technical Journal, 1958
- The Potentials of Infinite Systems of Sources and Numerical Solutions of Problems in Semiconductor EngineeringBell System Technical Journal, 1955