Characterization Of X-Ray Optics By Synchrotrcn Radiation
- 27 November 1989
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- p. 220-225
- https://doi.org/10.1117/12.961827
Abstract
A reflectometer has been set up at the radiometric laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY. The reflectometer is used in connection with a toroidal grating monochromator and operates primarily in the wavelength range from 5 nm to 40 nm. The instrumentation is described and examples are given for the characterization of multilayer mirrors and transmission gratings.Keywords
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