In situ TEM study of dislocation mobility in semiconducting materials
- 1 January 1993
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 4 (2-3) , 199-210
- https://doi.org/10.1051/mmm:0199300402-3019900
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Dislocation cores in semiconductors. From the « shuffle or glide » dispute to the « glide and shuffle » partnershipRevue de Physique Appliquée, 1987