Ex situ and in situ determination of stress distributions in chromium oxide films by raman microscopy
- 31 December 1992
- journal article
- Published by Elsevier in Corrosion Science
- Vol. 33 (1) , 1-12
- https://doi.org/10.1016/0010-938x(92)90014-t
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- An investigation of the growth-mechanism of Cr2O3 on pure chromium in 1 atm oxygen at 950 COxidation of Metals, 1987
- Novel applications of Raman microscopyPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1986
- Overview no. 48Acta Metallurgica, 1986
- A Raman Microscope Technique for Studying Liquids in a Diamond Anvil CellApplied Spectroscopy, 1984
- Ultrahigh pressure diamond-anvil cell and several semiconductor phase transition pressures in relation to the fixed point pressure scaleReview of Scientific Instruments, 1975
- Pressure Measurement Made by the Utilization of Ruby Sharp-Line LuminescenceScience, 1972
- The role of oxide microstructure and growth stresses in the high-temperature scaling of nickelMetallurgical Transactions, 1970
- The single-crystal Raman spectra of nearly opaque materials. Iron(III) oxide and chromium(III) oxideJ. Chem. Soc. A, 1970
- The Mechanism of Oxidation and TarnishingTransactions of The Electrochemical Society, 1947