Measurement of low interfacial tensions from diffuse reflection
- 1 August 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 82 (1) , 55-60
- https://doi.org/10.1016/0040-6090(81)90561-7
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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