Abstract
It is shown that a range of interfacial defects can exist in non-holosymmetric and non-symmorphic crystals, and that these are distinct from previously recognized types. The crystallographic methodology used to predict the character of these defects is outlined. Examples of defects in grain boundaries of diamond-structure and sphalerite-structure materials and NiSi2/Si and GaAs/Ge interphase boundaries are discussed. Experimental observations of the defects in interphase boundaries are considered briefly.

This publication has 5 references indexed in Scilit: