Influence of Ellipsoidal Energy Surfaces on the Differential Resistance of Schottky Barriers
- 15 November 1968
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 175 (3) , 1072-1076
- https://doi.org/10.1103/physrev.175.1072
Abstract
The tunneling probability has been derived for arbitrary orientations of the ellipsoids with respect to the plane of the barrier. The results are used to calculate the voltage current characteristics for multivalley semiconductors and, in particular, the differential resistivity for the , , and directions of -type germanium. For the particular cases studied, only a weak dependence of the tunneling current on orientation is predicted. The discrepancy between theory and the experimental results of Conley et al. is still unresolved.
Keywords
This publication has 4 references indexed in Scilit:
- Tunneling Spectroscopy in GaAsPhysical Review B, 1967
- Differential resistance peaks of Schottky barrier diodesSolid-State Electronics, 1967
- Electron Tunneling in Metal-Semiconductor BarriersPhysical Review B, 1966
- Tunneling from an Independent-Particle Point of ViewPhysical Review B, 1961