Artifacts in SPM measurements of thin films and coatings
- 1 December 1995
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 270 (1-2) , 356-361
- https://doi.org/10.1016/0040-6090(95)06747-7
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Atomic-Scale Friction Measurements Using Friction Force Microscopy: Part I—General Principles and New Measurement TechniquesJournal of Tribology, 1994
- Scanning tunneling microscopyJournal of Applied Physics, 1987