Determination of three orthogonal displacement components from one double exposure hologram
- 31 August 1972
- journal article
- Published by Elsevier in Optics & Laser Technology
- Vol. 4 (4) , 162-166
- https://doi.org/10.1016/0030-3992(72)90003-5
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Holographic measurement of surface distortion in three dimensionsOptics Technology, 1969
- Application of Hologram Interferometry to Plate Deformation and Translation MeasurementsOptica Acta: International Journal of Optics, 1969
- Étude des Faibles DÉplacements D'objets Opaques et de la Distorsion Optique dans les Lasers à Solide par InterfÉromÉtrie HolographiqueOptica Acta: International Journal of Optics, 1969
- Measurement of in-plane surface strain by hologram interferometryJournal of Physics E: Scientific Instruments, 1968
- Surface-Deformation Measurement Using the Wavefront Reconstruction TechniqueApplied Optics, 1966