Estimating Electronic Parameter End Points for Devices Which Suffer Abrupt Functional Failure during Radiation Testing

1 January 1985

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 32 (6) , 4250-4253
https://doi.org/10.1109/TNS.1985.4334103

Abstract

The abrupt failure of devices under test - especially during step-stress measurements presents special problems in determining parameter end points. This article shows how past procedures can be replaced by a method which can be applied with equal logical consistency to both the graceful degradation of parts as well as to the abrupt failure of parts. The article gives an example of how the method works and discusses its advantages and disadvantages

Keywords

PARAMETER ESTIMATION
ELECTRONIC EQUIPMENT TESTING
DEGRADATION
AEROSPACE TESTING
STRESS MEASUREMENT
PROBABILITY DISTRIBUTION
FAILURE ANALYSIS
LABORATORIES
DESIGN ENGINEERING
CIRCUITS

This publication has 1 reference indexed in Scilit:

Statistical Analysis of Step Stress Measurements in Hardness Assurance
IEEE Transactions on Nuclear Science, 1984