Experimental study of excess low-frequency noise in tin
- 15 January 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 25 (2) , 1427-1430
- https://doi.org/10.1103/physrevb.25.1427
Abstract
The excess low-frequency noise of tin films at room temperature has been studied. The magnitude of the noise was found to depend upon the type of substrate used and the strength of the adhesion between the film and the substrate. Samples prepared under the "proper" conditions were nearly two orders of magnitude quieter than reported by previous workers.Keywords
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