Stress and morphological development of CdS and ZnS thin films during the SILAR growth on (1 0 0)GaAs
- 1 December 2001
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 185 (1-2) , 134-139
- https://doi.org/10.1016/s0169-4332(01)00775-9
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
- Stress and surface studies of SILAR grown ZnS thin films on (100)GaAs substratesMaterials Science and Engineering: A, 2000
- SILAR deposition of CdxZn1-xS thin filmsApplied Surface Science, 2000
- Stress and surface studies of SILAR grown CdS thin films on GaAs(100)Thin Solid Films, 1999
- Stress and strain in the vacuum deposited thin filmsVacuum, 1998
- Growth of strongly orientated lead sulfide thin films by successive ionic layer adsorption and reaction (SILAR) techniqueJournal of Materials Chemistry, 1996
- Electroluminescent DisplaysPublished by World Scientific Pub Co Pte Ltd ,1995
- Characterization of Thin FilmsPublished by Elsevier ,1992
- Mechanical Properties of Thin Films and CoatingsMaterials Science Forum, 1991
- Mechanical Properties of Non-Metallic Thin FilmsPublished by Springer Nature ,1976
- Handbook of Thin Film TechnologyJournal of the Electrochemical Society, 1971