Hypothesis testing with finite memory in finite time (Corresp.)

1 May 1972

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Information Theory

Vol. 18 (3) , 429-431
https://doi.org/10.1109/tit.1972.1054820

Abstract

The hypothesis-testing problem has recently been studied under a finite-memory constraint. However, most work has been concerned with the large-sample theory. Here we study the small-sample theory for binary-valued observations.

Keywords

FINITE MEMORY
CORRESP
BINARY
CONSTRAINT
FINITE TIME
TESTING WITH FINITE
HYPOTHESIS TESTING

This publication has 1 reference indexed in Scilit:

Learning with Finite Memory
The Annals of Mathematical Statistics, 1970