Raman scattering in low wavenumber region as a new probe to structural properties of microcrystalline silicon
- 1 December 1983
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 59-60, 783-786
- https://doi.org/10.1016/0022-3093(83)90287-9
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Multiphonon Raman Spectrum of SiliconPhysical Review B, 1973